American Journal of Materials Science
p-ISSN: 2162-9382 e-ISSN: 2162-8424
2015; 5(3A): 39-47
doi:10.5923/s.materials.201502.07
S. Budak1, E. Gulduren2, B. Allen1, J. Cole1, J. Lassiter3, T. Colon4, C. Muntele5, R. Parker6, C. Smith7, R. B. Johnson1, 4
1Department of Electrical Engineering & Computer Science, Alabama A&M University, Normal, AL USA
2Department of Physics, University of Alabama in Huntsville, Huntsville, AL USA
3Materials Research Laboratory, Alabama A&M University, Normal, AL USA
4Department of Physics, Chemistry, and Mathematics, Alabama A&M University, Normal, AL USA
5Cygnus Scientific Services, Huntsville, AL USA
6Marshall Flight and Space Center, Huntsville, AL USA
74 SIGHT INC. Huntsville, AL USA
Correspondence to: S. Budak, Department of Electrical Engineering & Computer Science, Alabama A&M University, Normal, AL USA.
Email: |
Copyright © 2015 Scientific & Academic Publishing. All Rights Reserved.
We have prepared thermoelectric devices from alternating layers of Si/Si+Sb superlattice films using the electron beam deposition (EBD). In order to determine the stoichiometry of the elements and the thickness of the grown multi-layer film, Rutherford Backscattering Spectrometry (RBS) and RUMP simulation have been used. The 5 MeV Si ions bombardments have been performed using the AAMU Pelletron ion beam accelerator, to form quantum clusters in the multi-layer superlattice thin films to improve the thermoelectric and optical properties for more efficient thermoelectric devices. The fabricated multilayered thermoelectric devices have been characterized using cross plane electrical conductivity and Seebeck coefficient, van der Pauw resistivity, density, mobility, Hall coefficient, optical absorption, photoluminescence (PL), Raman, and AFM measurements. High-energy ion beam modification caused some remarkable thermoelectric and optical properties.
Keywords: Ion bombardment, Seebeck coefficient, Multi-Nanolayers, Figure of merit, van der Pauw resistivity, Hall Effect
Cite this paper: S. Budak, E. Gulduren, B. Allen, J. Cole, J. Lassiter, T. Colon, C. Muntele, R. Parker, C. Smith, R. B. Johnson, High Energy Radiation Effects on the Seebeck Coefficient, van der Pauw-Hall Effect Parameters and Optical Properties of Si/Si+Sb Multi-Nanolayered Thin Films, American Journal of Materials Science, Vol. 5 No. 3A, 2015, pp. 39-47. doi: 10.5923/s.materials.201502.07.
Figure 2. Fluence dependence of the cross- plane electrical conductivity of 20 alternating layers of Si/Si+Sb thin films |
Figure 3. Fluence dependence of optical absorption spectra of 20 alternating layers of Si/Si+Sb thin films |
Figure 4. Fluence dependence of photoluminescence spectra of 20 alternating layers of Si/Si+Sb thin films |
Figure 5. RBS and RUMP graphs of 50 alternating layers of Si/Si+Sb thin films |
Figure 6. Fluence dependence of the cross-plane Seebeck coefficient of 50 alternating layers of Si/Si+Sb thin films (a) at the different temperatures, (b) at room temperature |
Figure 7. Fluence dependence of the van der Pauw resistivity measurements of 50 alternating layers of Si/Si+Sb thin films at the different temperatures |
Figure 8. Fluence dependence of the van der Pauw resistivity measurements of 50 alternating layers of Si/Si+Sb thin films at the room temperature |
Figure 9. Fluence dependence of the density measurements of 50 alternating layers of Si/Si+Sb thin films at the different temperatures |
Figure 10. Fluence dependence of the mobility measurements of 50 alternating layers of Si/Si+Sb thin films at the different temperatures |
Figure 11. Fluence dependence of the Hall coefficient measurements of 50 alternating layers of Si/Si+Sb thin films at the different temperatures |
Figure 12. Raman spectra of 50 alternating Si/Si+Sb multilayer thin films: a) Unannealed and b) annealed at 100°C |
Figure 13. Photoluminescence Spectra of 50 alternating Si/Si+Sb multilayer thin films: a) Unannealed and b) annealed at 100°C |
Figure 14. Temperature dependence AFM images of 50 alternating multilayer Si/Si+Sb thin films |