Nanoscience and Nanotechnology
p-ISSN: 2163-257X e-ISSN: 2163-2588
2012; 2(1): 22-25
doi: 10.5923/j.nn.20120201.05
A. Shokuhfar , E. Eghdam , M. Alzamani
Mechanical Department (Advanced Materials and Nanotechnology Research Lab), K.N. Toosi University of Technology, Tehran, 19697 64499, Iran
Correspondence to: E. Eghdam , Mechanical Department (Advanced Materials and Nanotechnology Research Lab), K.N. Toosi University of Technology, Tehran, 19697 64499, Iran.
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It is known that silica sol-gel coatings microstructure depend on the components of the sol. In order to develop different microstructures of the silica coatings and comparing their optical properties, a variety of silica sols were prepared which were consist of TEOS, water, catalyst and changing the solvent content, at room temperature. Prepared glass surfaces were coated with silica sol using a dipping technique, with constant withdrawing rate. Prepared coatings were investigated by field-emission scanning electron microscopy (FE-SEM) and UV–Vis. spectroscopy. Transmittance spectra showed that silica coatings featured a distinct increase of substrate transmittance at all wavelengths (400-1100 nm). The result indicated that by increasing the solvent content, the porosity of coating increased and the coating was more densified therefore the silica coating transmittance increased by 3-4% points. FE-SEM showed that the nanostructure silica coating grain size were estimated ~20-40 nm.
Keywords: Solvent content, Silica, Transmittance, Sol-gel, Dip-coating
Cite this paper: A. Shokuhfar , E. Eghdam , M. Alzamani , "Effect of Solvent Content on the Properties of Nanostructure Silica Thin Film by Sol-Gel", Nanoscience and Nanotechnology, Vol. 2 No. 1, 2012, pp. 22-25. doi: 10.5923/j.nn.20120201.05.
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![]() | Figure 1. Flow chart of sol-gel processing for SiO2 films (The D factor indicate EtOH ratio molar) |
![]() | Figure 2. Optical transmittance spectra of coatings with different D factor |
![]() | Figure 3. Transmittance ratio (verage of T1/T0) of the SiO2-coated samples, T1, vs. the glass substrate, T0 , as a function of the precursor dilution, D |
![]() | Figure 4. FE-SEM micrograph of surface SiO2 films, (a) D=10, (b) D=15, (c) D=20 |