American Journal of Materials Science
p-ISSN: 2162-9382 e-ISSN: 2162-8424
2012; 2(6): 210-214
doi: 10.5923/j.materials.20120206.07
Wafaa M. S. Al-Khayat1, 2, Gerhard Wilde2
1Department of Physics, College of Science, Al-MustansiriyahUniversity, Baghdad, Iraq
2Institute for Material physics, University of Munster, Wilhem, Klemm-Str.10
Correspondence to: Wafaa M. S. Al-Khayat, Department of Physics, College of Science, Al-MustansiriyahUniversity, Baghdad, Iraq.
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SiliconNanoparticles with thickness ranging between 40 to 50 nm and an average diameter of 80 nm were prepared by Physical Vapour Deposition (electron beam). The Nanoparticles showed blue and visible light emission from 300 Ao to 900 Ao, with peak intensity at 350-700 Ao .Also AFM measurements were carried out and the regularity of silicon Nanoparticles was calculated and found to be equal to 0.3858 according to a quantitative hexagonal regularity calculation.
Keywords: Silicon nanoparticles, PVD, Surface morphology, Photoluminescence (PL), AFM
Cite this paper: Wafaa M. S. Al-Khayat, Gerhard Wilde, "Characteristics Study of Silicon Nanoparticles Produced by Physical Vapour Deposition", American Journal of Materials Science, Vol. 2 No. 6, 2012, pp. 210-214. doi: 10.5923/j.materials.20120206.07.
![]() | Figure 1. SEM micrographs of anodic porous alumina a)top view b) tilted view including the cross -section |
![]() | Figure 2. Photoluminescence spectrum of Si nanoparticles on a Si wafer |
![]() | Figure 3. SEM plane view of Si Nanoparticles a) atdeposition rate of 0.2(Ao/sec). b) atdeposition rate of 0.1(Ao/sec) |
![]() | Figure 4. Principle of the regularity analysis, depending on the Voronoi tessellation |
![]() | Figure 5. Regularity analysis of Nanoparticles |
The calculated hexagonal regularity, which equals R = 1 for perfect hexagonal order is equal to:RSi = 0.3858This value corresponds to a medium regularity with the size of the hexagonally ordered regions that span about the first and second nearest neighbour shells.The atomic force microscope produces topological images of surfaces at very highmagnification and it is even possible to observe the atomic structure of crystals. The aim of this study with the atomic force microscope is to obtain information about the formation of the surface. The morphology of the Si-nanoparticles film is very sensitive to the deposition parameters, such as the deposition rate, the position of the substrate and the regularity of the UTAM mask.![]() | Figure 6. AFM image of Si nanoparticles |